https://openalex.org/T13049
This cluster of papers focuses on the characterization and measurement of surface roughness in optical components, utilizing techniques such as fractal analysis, machine vision, scattering theory, and thin film analysis. The research covers topics such as surface roughness measurement, power spectral density analysis, micromorphology characterization, and the application of image processing for evaluating surface roughness.
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openalex:cited_by_count 311423 ;
openalex:works_count 43534 .