https://openalex.org/T11032
This cluster of papers focuses on various aspects of testing Very Large Scale Integration (VLSI) circuits, including techniques such as test data compression, embedded cores testing, scan testing, analog circuit fault diagnosis, BIST schemes, test access architectures, low-power testing, and delay fault testing.
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openalex:cited_by_count 419272 ;
openalex:works_count 47325 .