Surface Analysis and Electron Spectroscopy Techniques leaf node


URI

https://openalex.org/T12039

Label

Surface Analysis and Electron Spectroscopy Techniques

Description

This cluster of papers focuses on surface analysis and electron spectroscopy techniques, including X-ray photoelectron spectroscopy (XPS), scanning electron microscopy (SEM), electron inelastic mean free paths, ambient pressure photoelectron spectroscopy, and applications in surface science and nanomaterials characterization. It covers topics such as quantitative surface analysis, secondary electron emission, environmental scanning electron microscopy, and hard X-ray photoemission spectroscopy.

Implementation

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    rdfs:label "Surface Analysis and Electron Spectroscopy Techniques"@en ;
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    skos:broader oasubfields:2508 ;
    skos:definition "This cluster of papers focuses on surface analysis and electron spectroscopy techniques, including X-ray photoelectron spectroscopy (XPS), scanning electron microscopy (SEM), electron inelastic mean free paths, ambient pressure photoelectron spectroscopy, and applications in surface science and nanomaterials characterization. It covers topics such as quantitative surface analysis, secondary electron emission, environmental scanning electron microscopy, and hard X-ray photoemission spectroscopy."@en ;
    skos:inScheme openalex: ;
    skos:prefLabel "Surface Analysis and Electron Spectroscopy Techniques"@en ;
    openalex:cited_by_count 1720727 ;
    openalex:works_count 135181 .