Defect Identification using Positron Annihilation Spectroscopy leaf node


URI

https://openalex.org/T12579

Label

Defect Identification using Positron Annihilation Spectroscopy

Description

This cluster of papers focuses on the use of positron annihilation spectroscopy to identify defects in semiconductors, porous materials, and polymers. It includes experimental and theoretical studies on topics such as annihilation lifetime, free volume, nanostructures, and the application of muons in defect characterization.

Implementation

@prefix oasubfields: <https://openalex.org/subfields/> .
@prefix openalex: <https://lambdamusic.github.io/openalex-hacks/ontology/> .
@prefix owl: <http://www.w3.org/2002/07/owl#> .
@prefix rdfs: <http://www.w3.org/2000/01/rdf-schema#> .
@prefix skos: <http://www.w3.org/2004/02/skos/core#> .
@prefix xsd: <http://www.w3.org/2001/XMLSchema#> .

<https://openalex.org/T12579> a skos:Concept ;
    rdfs:label "Defect Identification using Positron Annihilation Spectroscopy"@en ;
    rdfs:isDefinedBy openalex: ;
    owl:sameAs <https://en.wikipedia.org/wiki/Positron_annihilation>,
        <https://openalex.org/T12579> ;
    skos:broader oasubfields:2211 ;
    skos:definition "This cluster of papers focuses on the use of positron annihilation spectroscopy to identify defects in semiconductors, porous materials, and polymers. It includes experimental and theoretical studies on topics such as annihilation lifetime, free volume, nanostructures, and the application of muons in defect characterization."@en ;
    skos:inScheme openalex: ;
    skos:prefLabel "Defect Identification using Positron Annihilation Spectroscopy"@en ;
    openalex:cited_by_count 338310 ;
    openalex:works_count 30801 .