Chemical Mechanical Polishing in Microelectronics Manufacturing leaf node


URI

https://openalex.org/T11301

Label

Chemical Mechanical Polishing in Microelectronics Manufacturing

Description

This cluster of papers focuses on the techniques, mechanisms, and simulations related to chemical mechanical polishing (CMP) in the context of microelectronics manufacturing. It covers topics such as material removal mechanisms, molecular dynamics simulation, ultra-precision grinding, surface and subsurface damage, nanometric cutting, magnetorheological finishing, polishing slurry chemistry, and tool wear.

Implementation

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    openalex:cited_by_count 430319 ;
    openalex:works_count 72162 .